oa Mutual Connection Between Concentration of Charge Carriers and Seebeck Coefficient in Si0.96Ge0.04 Thermoelectric by Annealing in the Range (523-673)K

By combining formulas known from the literature that relate thermoelectric parameters, the expression n≅1.13∙10¹⁹e^Sr-2/r_H(e^Sr-2-0.17) is obtained. That is, the  concentration of charge carriers can be determined using the Hall resistance and reduced Seebeck coefficient. Since these two parameters are calculated using the Seebeck coefficient, this coefficient is sufficient to determine the  concentration. To demonstrate the use of the obtained new formula, experimental data on SiGe thermoelectric are discussed.